半導體參數測試及元件特性分析

• Frequency range of 1Hz�50MHz
• Pulse width programmable from 10ns to near DC
• Dual independent channels
• Pulse amplitude range: 100mV�20V into 50Ω, 100mV�40V into 1MΩ
• Programmable parameters: Pulse width, duty cycle, rise time, fall time, amplitude, offset, delay, and pulse count

The Model 4205-PG2 dual-channel pulse generator is an option for the Model 4200-SCS semiconductor characterization system. This pulse generator produces voltage pulses as short as 10ns or up to ±20V (into 50W). Two pulse generators on one card provides you with the flexibility to apply pulses to two points on a DUT, such as the gate and the drain, simultaneously. Using a supplied User Test Module, it is simple to incorporate pulse generation into KITE test sequences. The pulse generator can also be used as a stand-alone pulse generator using the pulse generator's Windows® GUI. This GUI can control a wide range of variables, including pulse frequency, duty cycle, rise/fall time, amplitude, offset, delay, and the ability to trigger single pulses and/or pulse chains. The dual-channel pulse generator has a wide range of uses. Typical applications include charge pumping to characterize interface state densities in MOSFET devices; using AC stress pulses of varying frequencies to simulate real-world AC signals applied to clocked devices; basic clock generation for test vectoring and failure analysis; and digital triggering. The pulse generator can be purchased as an upgrade to existing 4200-SCS systems (KTEI version 6.0 or above required) or as an option for new 4200-SCS systems.

• Charge pumping (including tri-level charge pumping) for interface charge trap characterization
• Up to eight channels of pulse for parallel AC stress for stress/measure reliability testing
• Flash memory testing
• Clock generation for test vectoring and failure analysis
• Digital triggering for multi-pin device testing