半導體參數測試及元件特性分析
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應用在可靠度測試，特性分析測試，參數測試的半導體系統 |
- 參數測試系統
- S680 DC/RF Parametric Test System
- AdapTest Software Option
- Copper Analysis Library Option
- Keithley Recipe Manager Option
- KTE Keithley Test Environment
- Probe Card Manager Option
- 低電流開關
- Model 707A 6-Slot, Switching Matrix w/ up to 576 Ch
- Model 708A Single-Slot, Switching Matrix w/ up to 96 Ch
- Model 7072 8x12 Semiconductor Matrix Card (for Models 707A and 708A)
- Model 7072-HV 8x12, High-Voltage, Semiconductor Matrix Card (for Models 707A and 708A)
- Model 7174A 8x12, Low-Current, High-Speed Matrix Card (for Models 707A and 708A)
- 脈衝測試解決方案
- Model 4205-PG2 Dual-Channel Pulse Generator
- Model 4200-PIV-A Pulse I-V Option for the Model 4200-SCS (includes Models 4200-PG2 and 4200-SCP2, Software, and Specialized Interconnect Hardware)
- Model 4200-PIV-Q Pulse I-V with Q Point and Dual Channel Pulsing
- Model 4200-FLASH Non-Volatile Memory Test Option
- 儀器整合系統
- Model ACS Basic Edition Automated Characterization Suite for Component Characterization
- Automated Characterization Suite (ACS) Test Systems
- 元件特性系統
- Model ACS Basic Edition Automated Characterization Suite for Component Characterization
- Automated Characterization Suite (ACS) Test Systems
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 4200-CVU Integrated C-V Option for the Model 4200-SCS
- Model 4200-CVU-UPGRADE 4200-CVU Card and Upgrade for Existing 4200-SCS Systems
- Model 4200-CVU-PROBER-KIT Prober Accessory Kit for 4200-CVU
- Model 4205-PG2 Dual-Channel Pulse Generator
- Model 4200-SCP2 Dual-Channel Oscilloscope Card
- Model 4200-SCP2HR 200MS Dual-Channel Oscilloscope Card
- Model 4200-PIV-A Pulse I-V Option for the Model 4200-SCS (includes Models 4200-PG2 and 4200-SCP2, Software, and Specialized Interconnect Hardware)
- Model 4200-PIV-Q Pulse I-V with Q Point and Dual Channel Pulsing
- Model 4200-FLASH Non-Volatile Memory Test Option
- 可靠度測試
- Automated Characterization Suite (ACS) Test Systems
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 2612A Dual-channel System SourceMeter Instrument (200V, 10A Pulse)