光電測試方案

Document Actions

System 25 Laser Diode LIV Test System Kit

Part Number: SYSTEM25

Products available for purchase from our web store may include U.S. pricing displayed and can be ordered online by U.S. customers for end use in the U.S. only.

Key Features and Benefits:

Programmable LIV test system for laser diode modules
Sweep and measure 400 points in <8s
Very low noise current source (50μA) for laser diode drive
Up to 5A laser diode drive current
Measures optical power directly
1fA resolution for dark current measurements
Fully digital P-I-D loop for temperature control
±0.005^°C temperature stability, ±0.001^°C setpoint resolution
Trigger Link, source memory, and buffer memory support automatic test sequencing, which greatly reduces GPIB bus traffic to improve test throughput
Expandable and flexible for future requirements

Keithley's LIV (light-current-voltage) Test System Kit is designed to help manufacturers of laser diode modules (LDMs) keep pace with production demands by allowing them to boost yield and throughput. The LIV test system combines all the DC measurement capabilities required to test these modules with optical power measurement and tight temperature control over the device under test in an integrated instrument package. The LIV test system is configured from proven Keithley instrumentation; the basic configuration can be easily modified to add new measurement functions or to allow for new connections.