Keithley Introduces Tutorial CD for Reliability Testing of Semiconductor Devices

Keithley Introduces Tutorial CD for Reliability Testing of Semiconductor Devices

Cleveland, Ohio - January 12, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released an interactive, tutorial CD on reliability testing for semiconductor test engineers. "Understanding Measurements: Essential Reliability Testing Techniques" provides information related to stress measure testing of semiconductor devices, new measurement techniques, and how to improve test throughput and maintain data integrity. The CD, which is the second in Keithley's series of Test and Measurement Knowledge CDs, is available free of charge at http://www.keithley.com.sg/pr/005.html.

The CD contains three web seminars that discuss a variety of testing issues in detail, including:

Other material on the CD includes:

With more than 50 years of measurement expertise, Keithley Instruments (www.keithley.com.sg) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.