Keithley, Silver Sponsor of Nanotech 2005, Presents Three Technology Seminars during Conference
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Contact: Keithley Instruments, Inc. Keithley, Silver Sponsor of Nanotech 2005, Presents Three Technology Seminars during Conference Cleveland, Ohio - May 6, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces that it will participate as a silver sponsor at the NanoTech 2005 Conference, which will be held May 9 through 10 at the Anaheim Marriott & Convention Center in Anaheim, California. Additionally, Keithley will present three tutorial seminars during the conference, with two sessions focusing on making electrical measurements on nanoscale devices and a third on compact model verification. For further information on Nanotech 2005 and Keithley’s participation at this premier industry event, please visit http://www.keithley.com.sg/events/tradeshows/nano2005usa. A Nanoscale Devices Lunch-and-Learn seminar will be co-presented on Monday, May 9, from 12 noon to 1:30 p.m. PT. Jonathan Tucker, lead industry consultant at Keithley, will offer insight into electrical measurements required for nanotechnology and will discuss sources of measurement uncertainty that affect such sensitive measurements. Taylor Cavanah, a physicist at Zyvex Corporation, will discuss the advantages of probing individual transistors that are in-die. Please visit http://www.keithley.com.sg/promo/sr/022.html for further information and to register for this event. James Niemann, senior staff engineer at Keithley, will provide nanotechnologists with insight into low-level electrical measurements required for nanotechnology in his seminar, "Applying Electrical Measurement Techniques for Nanoscale Devices Using Semiconductor Characterization Systems." This seminar is part of the Nanoscale Characterization Tools Conference Workshop and will be presented on Monday, May 9, at 1:30 p.m. PT in Salon J-K of the Anaheim Marriott. "Measurement Requirements for Robust Compact Models" will be presented by Carl Scharrer, Keithley's principle industry consultant. Attendees will learn how to successfully apply accurate, robust, and traceable measurement technology to the compact models being developed for scaling mainstream MOS technology into the nanometer environment. This Compact Modeling Lunch-and-Learn event will be held on Wednesday, May 11, from 12 noon to 1:30 p.m. PT. Visit http://www.keithley.com.sg/promo/sr/023.html for more information and to register. Keithley has strengthened its test and measurement offering to the nanotechnology industry with several introductions during the past few years that offer highly sensitive instruments that are optimized for measuring the extremely small electrical signals associated with nanotech devices and materials. These instruments, which include the Model 4200 Characterization System and the new Models 6221/2182A AC/DC Current Source/Nanovoltmeter combination, will be featured in the Keithley exhibit, booth #407, at Nanotech 2005. Additionally, Keithley is partnering with Zyvex Corporation to offer complete solutions for Nanomanipulation/Electrical Characterization. About Keithley Instruments. With more than 50 years of measurement expertise, Keithley Instruments (www.keithley.com.sg) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products. Products and company names listed are trademarks or trade names of their respective companies. # # # |
page updated: 2005-09-28