IEEE MTT-S 2008 International Microwave Symposium

Show Dates: June 17-19, 2008

Location: Atlanta, GA (USA) 

Facility: Georgia World Congress Center

Booth Number: 727

IMS 2008 (www.ims2008.org) is the largest international conference devoted to the research, devRonpment, and application of RF and microwave theory and techniques. It is expected to draw over 10,000 participants and 700 exhibiting companies from around the world. This conference is organized and sponsored by the Microwave Theory and Techniques Society (MTT-S) of the Institute of Electrical and Electronics Engineers (IEEE).

Keithley Series 2900 Vector Signal Generators and Series 2800 Vector Signal Analyzers are designed to test a multitude of commercial standards, from GSM to LTE. With built-in DSP measurement processing, test times for complex signals are reduced by an order of magnitude. The instruments also support up to a 4x4 MIMO configuration for WLAN, WiMAX Wave 2, and LTE measurements.

In-Booth Demonstrations of Keithley Products will include:

• Model 2895 MIMO Synchronization Unit
• Model 2820 RF Vector Signal Analyzer 400MHz to 4 or 6GHz
• Model 2920 RF Vector Signal Generator 10MHz to 4 or 6GHz
• Model 2810 RF Vector Signal Analyzer 400MHz to 2.5GHz
• Model 2910 RF Vector Signal Generator 400MHz to 2.5GHz

Join us for a FREE Lunch-and-Learn Event at MTT-S
OFDM and MIMO Measurement Techniques

Tuesday, June 17 12:00-1:00PM

Georgia World Congress Center – Room A410 (4th level)

Receive Keithley's CD, Guide to OFDM/A Technology, MIMO Configurations and WLAN and WiMAX Applications when you attend.

Admission is Free, but seating is limited.

Click here to sign up today

Measurement Techniques for OFDM and MIMO Based Systems

Advanced OFDM (Orthogonal Frequency Division Multiplex) technologies impose additional challenges and requirements for testing new wireless communication devices and systems. This paper compares and contrasts traditional single-carrier modulation schemes with multi-carrier OFDM schemes to understand the test equipment and measurement considerations when using modern vector signal generators and analyzers. It covers in detail spectrum, power, and modulation quality measurements and techniques for R&D and high-speed production test applications. The paper covers testing of both SISO (single-input, single-output) and MIMO (multiple-input, multiple-output) communications systems used in 802.11n WLAN, 802.16e mobile-WiMAX Wave 2, which are also applicable to future LTE and UMB cellular standards.

By attending this seminar you will learn:

• Signal Generation and Analysis, Instrument Considerations.
  
• Spectrum measurement techniques and their application to high speed power measurements.
• OFDM Amplifier measurement considerations - Quantative Gain Compression.
• SISO OFDM measurement techniques.
• MIMO measurement considerations.
• MIMO measurement techniques.

This seminar is recommended for R&D engineers and manufacturering test engineers of wireless devices utilizing OFDM and MIMO technologies such as WiMAX, WLAN, LTE and UMB.

Presented by: Ron Rausch, Senior Marketing Manager for Keithley's RF Communications products. He has degrees in Electrical Engineering and Business Administration. Ron has over 30 years experience at HP, Agilent and Keithley Instruments working with RF and microwave test and measurement products in a wide variety of applications

Admission is Free, but seating is limited.

Click here to sign up today

General Show Information: click here

Click here for a free exhibit hall pass.

To register for the MTT-S Conference:
Click here to register on-line.

Click here to print registration form

DON'T FORGET TO VISIT US JUNE 18 OR 19

AT OUR MTT-S BOOTH, NO. 727, AND

ENTER OUR DRAWING FOR AN APPLE IPHONE.