奈米材料參數-高阻量測
Document Actions
- Products
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Model 6487 Picoammeter/Voltage Source
- Model 8009 Resistivity Test Chamber (for Models 6517A, 6517B)
- Documents