半導體-電阻係數量測
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- Products
- Model 2010 7-1/2-Digit, Low-Noise, Autoranging DMM
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Model 6487 Picoammeter/Voltage Source
- Model 8009 Resistivity Test Chamber (for Models 6517A, 6517B)