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電腦及週邊裝置

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在高度競爭的電腦產業，不論是電腦主機還是週邊製造商均需要高速、低成本的測試設備。美商吉時利儀器的測試方案含蓋了L-I-V(光-電流-電壓)、VCSEL(高容量儲存元件)，到電源供應器的加速折舊測試及加溫老化測試，週邊製造商只要部分的改變，就能有效降低測試瓶頸，增加產能。

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加速老化測試
CD/DVD接頭
平面顯示器
GMR 接頭
大量資料儲存系統
電源供應器
不斷電系統

Model 2701 DMM, Data Acquisition, Datalogging System w/2 Slots and Ethernet Support

Model 7708 40-Ch, Diff Mux Module w/ Automatic CJC and Screw Terminals (for Models 2700, 2701, and 2750)

Documents

應用摘記

#2260 Burn-in Testing Techniques for Switching Power Supplies

Network Primer/Programming Tutorial for the Model 2701 Ethernet-Based DMM/Data Acquisition System

技術文件

Fundamentals of HALT/HASS Testing

Instrument-Grade Data Acquisition with Ethernet Brings Precision Measurement and Control to Networks

Making AST/Burn-in Testing More Productive with Ethernet-based Instruments

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 2520 Pulsed Laser Diode Test System w/ Remote Test Head

Model 2750 DMM, Data Acquisition, Switching, Datalogging System w/ 5 Slots

Model 6485 5-1/2 digit Picoammeter with 10fA Resolution

Documents

應用摘記

#2214 High-Throughput DC Production Test of Telecommunications Laser Diode Modules

#2218 Production Testing of High-Intensity, Visible LEDs

#2273 VCSEL Testing with the Model 2400 SourceMeter Instrument

#2301 Measuring Laser Diode Optical Power with the Keithley Model 2500INT Integrating Sphere

#2352 Extending the Output Range of the Model 2510 TEC SourceMeter

#2402 DC Production Testing of OLED Displays

Making Pulsed Light Measurements with the Model 2520INT Integrating Sphere

Optimizing TEC PID Coefficients Automatically with the Model 2510-AT

技術文件

Combining Fiber Alignment and Device Characterization

Model 236 Source-Measure Unit

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

S400 Series Parametric Test System

Documents

技術文件

New Test Realities for Evolving FPD Technologies

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2750 DMM, Data Acquisition, Switching, Datalogging System w/ 5 Slots

Documents

應用摘記

#2217 Trigger Synchronization of Multiple SourceMeter Instruments

Model 2750 DMM, Data Acquisition, Switching, Datalogging System w/ 5 Slots

Model 7702 40-Ch, Diff Mux Module w/ Screw Terminals (for Models 2700, 2701, and 2750)

Documents

技術文件

Fundamentals of HALT/HASS Testing

Model 2700 DMM, Data Acquisition, Datalogging System w/ 2 Slots

Model 7702 40-Ch, Diff Mux Module w/ Screw Terminals (for Models 2700, 2701, and 2750)

Model 7705 40-Ch, Single-Pole Control Module (for Models 2700, 2701, and 2750)