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SEMATECH International Symposium on Advanced Gate Stack Technology
Albany, NY
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Nov. 30-Dec. 2, 2010
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汽車工業

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Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Part Number: 4200-SCS
Products available for purchase from our web store may include U.S. pricing displayed and can be ordered online by U.S. customers for end use in the U.S. only.

Key Features and Benefits:
  • Intuitive, point-and-click Windows®-based environment
  • Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
  • C-V instrument makes C-V measurements as easy as DC I-V
  • Pulse and pulse I-V capabilities for advanced semiconductor testing
  • Scope card provides integrated scope and pulse measure functionality
  • Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
  • Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
  • Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
  • Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
  • Includes software drivers for leading analytical probers

The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.

Optional Instrumentation:

  • Model 4225-PMU Ultra-Fast I-V Module
  • Model 4220-PGU Pulse Generator Unit (Voltage-Source only)
  • Model 4225-RPM Remote Amplifier/Switch
  • Model 4200-SMU Medium Power Source-Measure Unit
  • Model 4210-SMU High Power Source-Measure Unit for 4200-SCS
  • Model 4200-PA Remote PreAmp Option for 4200-SMU and 4210-SMU
  • Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit
  • Model 4200-SCP2 Dual-Channel Oscilloscope Card
  • Model 4200-SCP2HR 200MS Dual-Channel Oscilloscope Card
Ultra-Fast I-V Application Package:
  • Model 4225-PMU Ultra-Fast I-V Module

Related Applications:
  • Semiconductor Devices
  • - On-wafer parametric test
  • - Wafer level reliability
  • - Packaged device characterization
  • - C-V/I-V characterization with the Model 4200-SCS control of an external LCR meter
  • - High K gate charge trapping
  • - Isothermal testing of devices and materials subject to self-heating effects
  • - Charge pumping to characterize interface state densities in MOSFET devices
  • - Resistive or capacitive MEMS drive characterization
  • Optoelectronic Devices
  • - Semiconductor laser diode DC/CW characterization
  • - DC/CW characterization of transceiver modules
  • - PIN and APD characterization
  • Technology Development
  • - Carbon nanotube characterization
  • - Materials research
  • - Electrochemistry